J. E. Granata, W. E. Boyson, J. A. Kratochvil and M. A. Quintana
Year:
2009
Abstract:
This paper outlines the methodology used to test the DC output, outlines analysis techniques used to evaluate the array performance, provides a current reliability assessment, presents the comparative data for up to five years of use and exposure, and discusses the methods used to track down the causes of unexpected string-level degradation.